Relying solely on end-of-line testing isn't enough when security, traceability, and mission reliability are vital.

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. This article dives into the happens-before ...

With every process node advance, new types of manufacturing defects manifest. These defects are especially prevalent during the early phase. For early adopters, silicon manufacturing tests must evolve ...

The decision to change from a functional to a structural test methodology is a far-reaching one. Functional test vectors are meant to check for correct device functionality. Structural test vectors ...

The industry buzz on zero defect initiatives is growing, and semiconductor manufacturers are throwing resources at the challenge in order to satisfy their automotive customers. As the amount of ...

There is an expectation from consumers that today’s electronic products will just work and that electronic manufacturers have continued to improve the quality of their products. In most cases, this ...